项目作者: hjtaki

项目描述 :
wafer alignment, contamination, and levelling test tool
高级语言: Java
项目地址: git://github.com/hjtaki/android-wafer-diagnostic-tools.git
创建时间: 2018-07-09T18:30:38Z
项目社区:https://github.com/hjtaki/android-wafer-diagnostic-tools

开源协议:

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# wafer-diagnostic-tools

- It is a tool that helps check wafers condition before it to be microchips.

- Alignment, Edge Leveling, Particle check

0. Main

  1. - shows 3 test options

main

1. Alignment

  1. - check if a wafer is located at the expected position
  2. - by using TIS 1,2,3,4 sensor, it can figure out wafers position
  3. - possible results :
  4. - rotate clock wise, count clock wise
  5. - shift E,S,S,N
  6. - How to read result
  7. - blue line : defalt distance between each TIS and align mark
  8. - red line : real reading value

edgelevel

2. Leveling

  1. - check wafer is parlelly located
  2. - normal value is 0

alignment

3. Particle

  1. - wafers always should be super clean, check if wafers are contaminated
  2. - color show how wafers contaminated

particle